Assignee
FOUQUET CHRISTOPHE
US·1 granted patent·1 pending application·10 citations·filing 2007–2009
Top patents by PatentIndex Score
2 records- 0180US9710903B2System and method for detecting design and process defects on a wafer using process monitoring featuresFOUQUET CHRISTOPHE·Filed 2009·Granted Jul 18, 2017·10 cites·50 claims
- 0254US2007219841A1Facility modelization for facility benchmarkingFOUQUET CHRISTOPHE·Filed 2007·Application pending·0 cites
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