Assignee
FUJIKOSHI KIKAI KOGYO KK
JP·13 granted patents·1 pending application·462 citations·filing 1993–2001
Top patents by PatentIndex Score
14 records- 0196US5441444APolishing machineFUJIKOSHI KIKAI KOGYO KK·Filed 1993·Granted Aug 15, 1995·146 cites·11 claims
- 0292US5361545APolishing machineFUJIKOSHI KIKAI KOGYO KK·Filed 1993·Granted Nov 8, 1994·80 cites·11 claims
- 0386US6497047B1Flatness measuring equipmentFUJIKOSHI KIKAI KOGYO KK·Filed 2000·Granted Dec 24, 2002·48 cites·19 claims
- 0477US6361418B1Abrasive systemFUJIKOSHI KIKAI KOGYO KK·Filed 2000·Granted Mar 26, 2002·21 cites·4 claims
- 0576US5908347APolishing system for polishing waferFUJIKOSHI KIKAI KOGYO KK·Filed 1997·Granted Jun 1, 1999·50 cites·11 claims
- 0672US6080048APolishing machineFUJIKOSHI KIKAI KOGYO KK·Filed 1998·Granted Jun 27, 2000·41 cites·11 claims
- 0769US6319100B1Disk edge polishing machine and disk edge polishing systemFUJIKOSHI KIKAI KOGYO KK·Filed 2000·Granted Nov 20, 2001·16 cites·15 claims
- 0866US6422928B1Abrasive machineFUJIKOSHI KIKAI KOGYO KK·Filed 2000·Granted Jul 23, 2002·11 cites·16 claims
- 0959US6280304B1Abrasive machineFUJIKOSHI KIKAI KOGYO KK·Filed 1999·Granted Aug 28, 2001·22 cites·12 claims
- 1046US6290585B1Polishing machineFUJIKOSHI KIKAI KOGYO KK·Filed 2000·Granted Sep 18, 2001·2 cites·10 claims
- 1139US6189680B1Rotary conveyorFUJIKOSHI KIKAI KOGYO KK·Filed 1999·Granted Feb 20, 2001·6 cites·7 claims
- 1239US5879225APolishing machineFUJIKOSHI KIKAI KOGYO KK·Filed 1997·Granted Mar 9, 1999·9 cites·6 claims
- 1338US6367529B1Method of adhering wafers and wafer adhering deviceFUJIKOSHI KIKAI KOGYO KK·Filed 1999·Granted Apr 9, 2002·10 cites·17 claims
- 1432US2002005240A1Method of adhering wafers and wafer adhering deviceFUJIKOSHI KIKAI KOGYO KK·Filed 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when FUJIKOSHI KIKAI KOGYO KK files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →