Assignee
FUJISAKI KENICHI
JP·3 granted patents·1 pending application·4 citations·filing 2010–2011
Top patents by PatentIndex Score
4 records- 0164US8325547B2Test apparatus and repair analysis methodFUJISAKI KENICHI·Filed 2011·Granted Dec 4, 2012·3 cites·11 claims
- 0249US8261139B2Clear instruction information to indicate whether memory test failure information is validFUJISAKI KENICHI·Filed 2010·Granted Sep 4, 2012·1 cites·8 claims
- 0335US8677197B2Test apparatusFUJISAKI KENICHI·Filed 2011·Granted Mar 18, 2014·0 cites·15 claims
- 0432US2012117432A1Test apparatusFUJISAKI KENICHI·Filed 2011·Application pending·0 cites
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