Assignee
FUJISAWA AKIKO
JP·3 granted patents·4 citations·filing 2009–2010
Top patents by PatentIndex Score
3 records- 0170US9013572B2Method for observing sample and electronic microscopeFUJISAWA AKIKO·Filed 2009·Granted Apr 21, 2015·2 cites·13 claims
- 0267US8212224B2Charged particle beam deviceFUJISAWA AKIKO·Filed 2009·Granted Jul 3, 2012·2 cites·7 claims
- 0351US8288725B2Charged particle beam deviceFUJISAWA AKIKO·Filed 2010·Granted Oct 16, 2012·0 cites·5 claims
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