Assignee
FUJISAWA HIDEO
JP·2 granted patents·1 pending application·0 citations·filing 2011–2015
Top patents by PatentIndex Score
3 records- 0158US9163324B2Method for producing nitride crystalFUJISAWA HIDEO·Filed 2012·Granted Oct 20, 2015·0 cites·18 claims
- 0253US8574532B2Method for producing semiconductor crystal, apparatus for crystal production and group 13 element nitride semiconductor crystalFUJISAWA HIDEO·Filed 2011·Granted Nov 5, 2013·0 cites·11 claims
- 0353US2015354086A1Method for producing nitride crystalFUJISAWA HIDEO·Filed 2015·Application pending·0 cites
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