Assignee
FUJIWARA HIROKAZU
JP·6 granted patents·2 pending applications·30 citations·filing 2006–2013
Top patents by PatentIndex Score
8 records- 0191US8440524B2Semiconductor device manufacturing methodFUJIWARA HIROKAZU·Filed 2011·Granted May 14, 2013·14 cites·15 claims
- 0285US8748975B2Switching element and manufacturing method thereofFUJIWARA HIROKAZU·Filed 2012·Granted Jun 10, 2014·7 cites·9 claims
- 0382US8216667B2Tantalum carbide-coated carbon material and production method thereofFUJIWARA HIROKAZU·Filed 2006·Granted Jul 10, 2012·5 cites·20 claims
- 0476US9201094B2Wafer examination device and wafer examination methodFUJIWARA HIROKAZU·Filed 2013·Granted Dec 1, 2015·3 cites·11 claims
- 0557US8164100B2Semiconductor device and method of manufacturing thereofFUJIWARA HIROKAZU·Filed 2008·Granted Apr 24, 2012·1 cites·2 claims
- 0643US9607836B2Semiconductor device and manufacturing method of semiconductor deviceFUJIWARA HIROKAZU·Filed 2013·Granted Mar 28, 2017·0 cites·3 claims
- 0743US2009160008A1Semiconductor device and method of manufacturing the sameFUJIWARA HIROKAZU·Filed 2008·Application pending·0 cites
- 0837US2013105889A1Switching device and method for manufacturing the sameFUJIWARA HIROKAZU·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →