Assignee
FUJIWARA YOSHINORI
JP·5 granted patents·16 citations·filing 2010–2012
Top patents by PatentIndex Score
5 records- 0184US8230274B2JTAG controlled self-repair after packagingFUJIWARA YOSHINORI·Filed 2012·Granted Jul 24, 2012·7 cites·15 claims
- 0280US8159890B2Redundant memory array for replacing memory sections of main memoryFUJIWARA YOSHINORI·Filed 2011·Granted Apr 17, 2012·5 cites·20 claims
- 0366US8437208B2Redundant memory array for replacing memory sections of main memoryFUJIWARA YOSHINORI·Filed 2012·Granted May 7, 2013·2 cites·21 claims
- 0465US8122304B2JTAG controlled self-repair after packagingFUJIWARA YOSHINORI·Filed 2010·Granted Feb 21, 2012·2 cites·19 claims
- 0543US8736291B2Methods for defect testing of externally accessible integrated circuit interconnectsFUJIWARA YOSHINORI·Filed 2011·Granted May 27, 2014·0 cites·6 claims
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