Assignee
FUJIYOSHI KENTARO
JP·3 granted patents·1 pending application·1 citations·filing 2011–2012
Top patents by PatentIndex Score
4 records- 0173US8866093B2Detection device manufacturing method, detection device, and detection systemFUJIYOSHI KENTARO·Filed 2012·Granted Oct 21, 2014·1 cites·12 claims
- 0255US8586399B2Detection device manufacturing method using impurity semiconductor layer in arrayed pixelsFUJIYOSHI KENTARO·Filed 2012·Granted Nov 19, 2013·0 cites·18 claims
- 0353US2012261581A1Method for manufacturing detector, radiation detection apparatus including detector manufactured thereby, and radiation detection systemFUJIYOSHI KENTARO·Filed 2012·Application pending·0 cites
- 0446US8405039B2Detection apparatus and radiation detection systemFUJIYOSHI KENTARO·Filed 2011·Granted Mar 26, 2013·0 cites·8 claims
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