Assignee
FUKASAWA MASANAGA
JP·1 granted patent·2 pending applications·8 citations·filing 2006–2012
Top patents by PatentIndex Score
3 records- 0187US8871633B2Semiconductor device and manufacturing method of the sameFUKASAWA MASANAGA·Filed 2012·Granted Oct 28, 2014·8 cites·15 claims
- 0239US2007232047A1Damage recovery method for low K layer in a damascene interconnectionFUKASAWA MASANAGA·Filed 2006·Application pending·0 cites
- 0338US2007222076A1Single or dual damascene structure reducing or eliminating the formation of micro-trenches arising from lithographic misalignmentFUKASAWA MASANAGA·Filed 2006·Application pending·0 cites
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