Assignee
FUKUTOMI HIROYUKI
JP·1 granted patent·1 pending application·5 citations·filing 2007–2010
Technology mixG01N2
Top patents by PatentIndex Score
2 records- 0168US8100014B2Ultrasonic flaw detection apparatus and ultrasonic flaw detection programFUKUTOMI HIROYUKI·Filed 2007·Granted Jan 24, 2012·5 cites·11 claims
- 0231US2012060609A1Non-Destructive Inspection Scanning Apparatus And Non-Destructive Inspection ApparatusFUKUTOMI HIROYUKI·Filed 2010·Application pending·0 cites
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