Assignee
FUNK JOERG-MICHAEL
0 granted patents·6 pending applications·0 citations·filing 2004–2007
Top patents by PatentIndex Score
6 records- 0147US2008285123A1Raster scanning light microscopeFUNK JOERG-MICHAEL·Filed 2007·Application pending·0 cites
- 0247US2009046360A1Raster scanning light microscope with line pattern scanning and applicationsFUNK JOERG-MICHAEL·Filed 2007·Application pending·0 cites
- 0342US2006012864A1Raster scanning light microscope with line pattern scanning and applicationsFUNK JOERG-MICHAEL·Filed 2004·Application pending·0 cites
- 0442US2006011857A1Raster scanning light microscope with line pattern scanning and applicationsFUNK JOERG-MICHAEL·Filed 2004·Application pending·0 cites
- 0540US2006012874A1Raster scanning light microscope with punctiform light source distribution and applicationsFUNK JOERG-MICHAEL·Filed 2004·Application pending·0 cites
- 0639US2006012785A1Light scanning electron microscope and useFUNK JOERG-MICHAEL·Filed 2004·Application pending·0 cites
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