Assignee
FURUKAWA YASUNORI
JP·3 granted patents·3 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0168US8400641B2Interferometer for aspherical or spherical surface measurementsFURUKAWA YASUNORI·Filed 2010·Granted Mar 19, 2013·3 cites·13 claims
- 0246US8184263B2Measurement apparatus and exposure apparatusFURUKAWA YASUNORI·Filed 2009·Granted May 22, 2012·0 cites·1 claims
- 0339US9297646B2Measurement method and measurement apparatusFURUKAWA YASUNORI·Filed 2011·Granted Mar 29, 2016·0 cites·10 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →