Assignee
GE INSPECTION TECH GMBH
DE·4 granted patents·37 citations·filing 2003–2006
Top patents by PatentIndex Score
4 records- 0176US7581444B2Method and circuit arrangement for disturbance-free examination of objects by means of ultrasonic wavesGE INSPECTION TECH GMBH·Filed 2004·Granted Sep 1, 2009·16 cites·22 claims
- 0272US7181970B2Method and device for testing a component having a complex surface contour by means of ultrasoundGE INSPECTION TECH GMBH·Filed 2004·Granted Feb 27, 2007·11 cites·6 claims
- 0368US7694566B2Method of evaluating ultrasonic signals of a flaw in a workpieceGE INSPECTION TECH GMBH·Filed 2003·Granted Apr 13, 2010·8 cites·9 claims
- 0465US7798003B2Ultrasound probe arrangementGE INSPECTION TECH GMBH·Filed 2006·Granted Sep 21, 2010·2 cites·8 claims
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