Assignee
GENRAD INC
US62 patents
Top patents by PatentIndex Score
US5506510AApr 9, 1996
Adaptive alignment probe fixture for circuit board tester
GENRAD INC89 citations96
US6393458B1May 21, 2002
Method and apparatus for load balancing in a distributed object architecture
GENRAD INC219 citations94
US6138143AOct 24, 2000
Method and apparatus for asynchronous transaction processing
GENRAD INC323 citations94
US5861743AJan 19, 1999
Hybrid scanner for use in an improved MDA tester
GENRAD INC89 citations94
US6175230B1Jan 16, 2001
Circuit-board tester with backdrive-based burst timing
GENRAD INC110 citations93
US5457380AOct 10, 1995
Circuit-test fixture that includes shorted-together probes
GENRAD INC20 citations93
US5786697AJul 28, 1998
Capacitive open-circuit and short-circuit tests of component connections to circuit boards
GENRAD INC17 citations92
US5391993AFeb 21, 1995
Capacitive open-circuit test employing threshold determination
GENRAD INC26 citations92
US5748672AMay 5, 1998
System for measuring jitter in a non-binary digital signal
GENRAD INC85 citations91
US5736862AApr 7, 1998
System for detecting faults in connections between integrated circuits and circuit board traces
GENRAD INC39 citations90
US5057775AOct 15, 1991
Method of testing control matrices for flat-panel displays
GENRAD INC34 citations90
US4782324ANov 1, 1988
Digital signal synthesizer
GENRAD INC30 citations90
US4228537AOct 14, 1980
Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis
GENRAD INC76 citations90
US4196475AApr 1, 1980
Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques
GENRAD INC46 citations90
US6550669B1Apr 22, 2003
Integral heating nozzle and pickup tube
GENRAD INC29 citations89
US5486753AJan 23, 1996
Simultaneous capacitive open-circuit testing
GENRAD INC37 citations88
US5172377ADec 15, 1992
Method for testing mixed scan and non-scan circuitry
GENRAD INC43 citations88
US5124638AJun 23, 1992
Automatic circuit tester employing a three-dimensional switch-matrix layout
GENRAD INC36 citations88
US4951283AAug 21, 1990
Method and apparatus for identifying defective bus devices
GENRAD INC34 citations88
US4808815AFeb 28, 1989
Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement
GENRAD INC51 citations87
US5124636AJun 23, 1992
Tester interconnect system
GENRAD INC37 citations86
US4242751ADec 30, 1980
Automatic fault-probing method and apparatus for checking electrical circuits and the like
GENRAD INC67 citations86
US5282211AJan 25, 1994
Slip detection during bit-error-rate measurement
GENRAD INC34 citations85
US4236246ANov 25, 1980
Method of and apparatus for testing electronic circuit assemblies and the like
GENRAD INC31 citations85
US4977370ADec 11, 1990
Apparatus and method for circuit board testing
GENRAD INC55 citations82
US4459693AJul 10, 1984
Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
GENRAD INC44 citations81
US4342089AJul 27, 1982
Method of and apparatus for automatic measurement of circuit parameters with microprocessor calculation techniques
GENRAD INC20 citations79
US4242631ADec 30, 1980
Front-end circuit apparatus for impedance measurements and the like
GENRAD INC20 citations79
US4414664ANov 8, 1983
Wait circuitry for interfacing between field maintenance processor and device specific adaptor circuit
GENRAD INC23 citations77
US5101150AMar 31, 1992
Automatic circuit tester with separate instrument and scanner buses
GENRAD INC21 citations75
US5602490AFeb 11, 1997
Connector for automatic test equipment
GENRAD INC13 citations74
US4937535AJun 26, 1990
Calibration method and programmable phase-gain amplifier
GENRAD INC21 citations74
US4686391AAug 11, 1987
Fast-acting comparison circuit
GENRAD INC11 citations74
US4290013ASep 15, 1981
Method of and apparatus for electrical short testing and the like
GENRAD INC18 citations74
US4594558AJun 10, 1986
High-switching-speed d.c. amplifier with input-offset current compensation
GENRAD INC9 citations72
US4523154AJun 11, 1985
Enhanced-accuracy semiconductor power amplifier
GENRAD INC8 citations72
US5414715AMay 9, 1995
Method for automatic open-circuit detection
GENRAD INC17 citations71
US5027298AJun 25, 1991
Low-dead-time interval timer
GENRAD INC18 citations71
US4727312AFeb 23, 1988
Circuit tester
GENRAD INC15 citations71
US4300846ANov 17, 1981
High speed print head system and method
GENRAD INC9 citations71
US5440568AAug 8, 1995
System for determining the operations of an integrated circuit and processor for use therein
GENRAD INC7 citations70
US5127009AJun 30, 1992
Method and apparatus for circuit board testing with controlled backdrive stress
GENRAD INC19 citations69
US4764694AAug 16, 1988
Interpolating time-measurement apparatus
GENRAD INC19 citations69
US6363217B1Mar 26, 2002
Convective heater employing foam metal diffuser
GENRAD INC12 citations68
US4569048AFeb 4, 1986
Method and apparatus for memory overlay
GENRAD INC17 citations68
US6114848ASep 5, 2000
Direct-measurement provision of safe backdrive levels
GENRAD INC13 citations67
US5811980ASep 22, 1998
Test system for determining the orientation of components on a circuit board
GENRAD INC16 citations67
US4740895AApr 26, 1988
Method of and apparatus for external control of computer program flow
GENRAD INC17 citations67
US4554630ANov 19, 1985
Control apparatus for back-driving computer memory and forcing execution of idle loop program in external memory
GENRAD INC17 citations67
US4520416AMay 28, 1985
Shunt-foldback voltage source
GENRAD INC14 citations67
Showing the top 50 of 62 patents by PatentIndex Score.