Assignee
GHOSH NILANJAN
US·1 granted patent·1 pending application·0 citations·filing 2013–2016
Top patents by PatentIndex Score
2 records- 0136US9441952B2Metrology tool for electroless copper thickness measurement for BBUL process development monitoringGHOSH NILANJAN·Filed 2013·Granted Sep 13, 2016·0 cites·16 claims
- 0231US2017284943A1Detecting voids and delamination in photoresist layerGHOSH NILANJAN·Filed 2016·Application pending·0 cites
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