Assignee
GRANVILLE PHILLIPS COMPANY
US·12 granted patents·323 citations·filing 1980–1998
Top patents by PatentIndex Score
12 records- 0188US4866640ATemperature compensation for pressure gaugeGRANVILLE PHILLIPS COMPANY·Filed 1987·Granted Sep 12, 1989·58 cites·16 claims
- 0287US5422573AIonization gauge and method of using and calibrating sameGRANVILLE PHILLIPS COMPANY·Filed 1993·Granted Jun 6, 1995·54 cites·74 claims
- 0383US4636680AVacuum gaugeGRANVILLE PHILLIPS COMPANY·Filed 1983·Granted Jan 13, 1987·24 cites·44 claims
- 0479US5128617AIonization vacuum gauge with emission of electrons in parallel pathsGRANVILLE PHILLIPS COMPANY·Filed 1990·Granted Jul 7, 1992·35 cites·101 claims
- 0576US5250906AIonization gauge and method of using and calibrating sameGRANVILLE PHILLIPS COMPANY·Filed 1991·Granted Oct 5, 1993·38 cites·45 claims
- 0670US4307323AVacuum gaugeGRANVILLE PHILLIPS COMPANY·Filed 1980·Granted Dec 22, 1981·14 cites·17 claims
- 0769US5296817AIonization gauge and method of using and calibrating sameGRANVILLE PHILLIPS COMPANY·Filed 1992·Granted Mar 22, 1994·22 cites·94 claims
- 0866US4714891AMethod and apparatus for improving the safety and extending the range of ionization gauge systemsGRANVILLE PHILLIPS COMPANY·Filed 1985·Granted Dec 22, 1987·24 cites·70 claims
- 0958US6025723AMiniature ionization gauge utilizing multiple ion collectorsGRANVILLE PHILLIPS COMPANY·Filed 1997·Granted Feb 15, 2000·10 cites·17 claims
- 1056US5902932AForce balancing capacitance manometerGRANVILLE PHILLIPS COMPANY·Filed 1998·Granted May 11, 1999·19 cites·62 claims
- 1151US5452613AWide range vacuum gaugeGRANVILLE PHILLIPS COMPANY·Filed 1993·Granted Sep 26, 1995·15 cites·36 claims
- 1243US5801535AIonization gauge and method of using and calibrating sameGRANVILLE PHILLIPS COMPANY·Filed 1996·Granted Sep 1, 1998·10 cites·72 claims
Join the waitlist — get patent alerts
Get an alert when GRANVILLE PHILLIPS COMPANY files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →