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GUO RUIFENG
US7 patents
Top patents by PatentIndex Score
US8316265B2Nov 20, 2012
Test pattern generation for diagnosing scan chain failures
GUO RUIFENG17 citations92
US8261142B2Sep 4, 2012
Generating test sets for diagnosing scan chain failures
GUO RUIFENG14 citations92
US8615695B2Dec 24, 2013
Fault dictionary-based scan chain failure diagnosis
GUO RUIFENG8 citations84
US9086459B2Jul 21, 2015
Detection and diagnosis of scan cell internal defects
GUO RUIFENG10 citations83
US8935582B2Jan 13, 2015
Generating test sets for diagnosing scan chain failures
GUO RUIFENG3 citations62
US8527232B2Sep 3, 2013
Diagnostic test pattern generation for small delay defect
GUO RUIFENG4 citations62
US8468409B2Jun 18, 2013
Speed-path debug using at-speed scan test patterns
GUO RUIFENG0 citations51