Assignee
HAH JUNG-HWAN
KR·3 granted patents·4 pending applications·0 citations·filing 2006–2012
Top patents by PatentIndex Score
7 records- 0152US8551759B2Oligomer probe array and method of producing the sameHAH JUNG-HWAN·Filed 2007·Granted Oct 8, 2013·0 cites·31 claims
- 0248US2012208723A1Oligomer probe array with improved signal-to-noise ratio and detection sensitivity and method of manufacturing the sameHAH JUNG-HWAN·Filed 2012·Application pending·0 cites
- 0348US2008038712A1Oligomer Probe Array with Improved Signal-to-Noise Ratio and Detection Sensitivity and Method of Manufacturing the SameHAH JUNG-HWAN·Filed 2007·Application pending·0 cites
- 0444US2008119372A1Microarray and Method of Fabricating the SameHAH JUNG-HWAN·Filed 2007·Application pending·0 cites
- 0543US8241837B2Mask pattern for semiconductor device fabrication, method of forming the same, and method of fabricating finely patterned semiconductor deviceHAH JUNG-HWAN·Filed 2010·Granted Aug 14, 2012·0 cites·59 claims
- 0642US8546130B2Oligomer probe array with improved signal-to-noise ratio fabrication method thereofHAH JUNG-HWAN·Filed 2007·Granted Oct 1, 2013·0 cites·12 claims
- 0739US2007023916A1Semiconductor structure with multiple bottom anti-reflective coating layer and method of forming photoresist pattern and pattern of semiconductor device using the same structureHAH JUNG-HWAN·Filed 2006·Application pending·0 cites
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