Assignee
HASEGAWA YOSHIAKI
JP·4 granted patents·1 pending application·8 citations·filing 2005–2012
Top patents by PatentIndex Score
5 records- 0181US9209743B2Fault detection apparatus and fault detection methodHASEGAWA YOSHIAKI·Filed 2012·Granted Dec 8, 2015·6 cites·27 claims
- 0271US8306085B2Nitride compound semiconductor element and method for manufacturing sameHASEGAWA YOSHIAKI·Filed 2011·Granted Nov 6, 2012·2 cites·8 claims
- 0349US8194711B2Nitride semiconductor laser deviceHASEGAWA YOSHIAKI·Filed 2009·Granted Jun 5, 2012·0 cites·4 claims
- 0449US2008160919A1Radio access point testing method and testing apparatusHASEGAWA YOSHIAKI·Filed 2008·Application pending·0 cites
- 0538US8082006B2Base station, receiving apparatus, and receiver trouble diagnosing methodHASEGAWA YOSHIAKI·Filed 2005·Granted Dec 20, 2011·0 cites·5 claims
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