Assignee
HAYAKAWA KOICHI
JP·7 granted patents·2 pending applications·29 citations·filing 2008–2012
Top patents by PatentIndex Score
9 records- 0188US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0272US8134697B2Inspection apparatus for inspecting patterns of substrateHAYAKAWA KOICHI·Filed 2009·Granted Mar 13, 2012·4 cites·6 claims
- 0371US8523806B2SprayerHAYAKAWA KOICHI·Filed 2009·Granted Sep 3, 2013·6 cites·21 claims
- 0470US8268225B2Medical device manufacturing method and medical device assemblyHAYAKAWA KOICHI·Filed 2010·Granted Sep 18, 2012·2 cites·8 claims
- 0568US8545457B2SprayerHAYAKAWA KOICHI·Filed 2008·Granted Oct 1, 2013·4 cites·20 claims
- 0664US8419675B2ApplicatorHAYAKAWA KOICHI·Filed 2010·Granted Apr 16, 2013·2 cites·13 claims
- 0759US8763933B2SprayerHAYAKAWA KOICHI·Filed 2009·Granted Jul 1, 2014·1 cites·6 claims
- 0851US2012316542A1Medical device manufacturing method and medical device assemblyHAYAKAWA KOICHI·Filed 2012·Application pending·0 cites
- 0946US2009232178A1Two-wavelength semiconductor laser deviceHAYAKAWA KOICHI·Filed 2009·Application pending·0 cites
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