Assignee
HAYASHI KAZUYUKI
JP·6 granted patents·46 citations·filing 1997–2012
Top patents by PatentIndex Score
6 records- 0194US8137872B2Reflective mask blank for EUV lithographyHAYASHI KAZUYUKI·Filed 2010·Granted Mar 20, 2012·10 cites·20 claims
- 0293US8288062B2Reflective mask blank for EUV lithographyHAYASHI KAZUYUKI·Filed 2012·Granted Oct 16, 2012·9 cites·23 claims
- 0389US8227152B2Reflective mask blank for EUV lithographyHAYASHI KAZUYUKI·Filed 2011·Granted Jul 24, 2012·6 cites·32 claims
- 0489US8168352B2Reflective mask blank for EUV lithography and mask for EUV lithographyHAYASHI KAZUYUKI·Filed 2011·Granted May 1, 2012·9 cites·44 claims
- 0589US8133643B2Reflective mask blank for EUV lithographyHAYASHI KAZUYUKI·Filed 2011·Granted Mar 13, 2012·6 cites·37 claims
- 0635US5944664AMethod of measuring the amount of dislocation of cervical vertebraeHAYASHI KAZUYUKI·Filed 1997·Granted Aug 31, 1999·6 cites·30 claims
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