Assignee
HENG FOOK-LUEN
US4 patents
Top patents by PatentIndex Score
US8423941B2Apr 16, 2013
Structural migration of integrated circuit layout
HENG FOOK-LUEN9 citations83
US8522173B2Aug 27, 2013
Spatial correlation-based estimation of yield of integrated circuits
HENG FOOK-LUEN4 citations62
US8276102B2Sep 25, 2012
Spatial correlation-based estimation of yield of integrated circuits
HENG FOOK-LUEN2 citations62
US8108803B2Jan 31, 2012
Geometry based electrical hotspot detection in integrated circuit layouts
HENG FOOK-LUEN2 citations62