Assignee

HETZER PETRA

DE·1 granted patent·1 pending application·0 citations·filing 2010–2010

Technology mixH10P2 G01N1 H01L1 H10D1

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2 records

0133US8925396B2Method and system for particles analysis in microstructure devices by isolating particlesHETZER PETRA·Filed 2010·Granted Jan 6, 2015·0 cites·22 claims
0228US2010248498A1Material stripping in semiconductor devices by evaporationHETZER PETRA·Filed 2010·Application pending·0 cites

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