Assignee
HICHRI HABIB
US·2 granted patents·3 citations·filing 2012–2013
Top patents by PatentIndex Score
2 records- 0171US8492280B1Method for simultaneously forming features of different depths in a semiconductor substrateHICHRI HABIB·Filed 2012·Granted Jul 23, 2013·3 cites·15 claims
- 0250US8901005B2Method for simultaneously forming features of different depths in a semiconductor substrateHICHRI HABIB·Filed 2013·Granted Dec 2, 2014·0 cites·14 claims
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