Assignee
HIROTA TOSHIYUKI
JP·7 granted patents·5 pending applications·29 citations·filing 2008–2014
Top patents by PatentIndex Score
12 records- 0191US8288241B2Semiconductor device, method of manufacturing the same and adsorption site blocking atomic layer deposition methodHIROTA TOSHIYUKI·Filed 2011·Granted Oct 16, 2012·14 cites·20 claims
- 0281US8169015B2Semiconductor device and manufacturing method thereforHIROTA TOSHIYUKI·Filed 2008·Granted May 1, 2012·6 cites·15 claims
- 0370US8071439B2Method for manufacturing semiconductor deviceHIROTA TOSHIYUKI·Filed 2009·Granted Dec 6, 2011·4 cites·11 claims
- 0467US8999827B2Semiconductor device manufacturing methodHIROTA TOSHIYUKI·Filed 2011·Granted Apr 7, 2015·2 cites·20 claims
- 0565US8283227B2Method for manufacturing semiconductor memory deviceHIROTA TOSHIYUKI·Filed 2011·Granted Oct 9, 2012·2 cites·20 claims
- 0663US8062979B2Semiconductor device manufacturing method having high aspect ratio insulating filmHIROTA TOSHIYUKI·Filed 2008·Granted Nov 22, 2011·1 cites·14 claims
- 0754USRE45361ESemiconductor device manufacturing method having high aspect ratio insulating filmHIROTA TOSHIYUKI·Filed 2013·Granted Feb 3, 2015·0 cites·20 claims
- 0844US2016087028A1Semiconductor device and method for manufacturing sameHIROTA TOSHIYUKI·Filed 2014·Application pending·0 cites
- 0942US2012254572A1Information terminal and security management methodHIROTA TOSHIYUKI·Filed 2012·Application pending·0 cites
- 1039US2012146859A1Wireless communication apparatusHIROTA TOSHIYUKI·Filed 2011·Application pending·0 cites
- 1138US2012064690A1Method for manufacturing semiconductor deviceHIROTA TOSHIYUKI·Filed 2011·Application pending·0 cites
- 1237US2012061800A1Capacitor element, manufacturing method thereof and semiconductor deviceHIROTA TOSHIYUKI·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →