Assignee
HITACHI HIGH TECH SCIENCE CORP
JP·214 granted patents·45 pending applications·297 citations·filing 2012–2024
Top patents by PatentIndex Score
259 records- 0197US10088401B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Oct 2, 2018·14 cites·13 claims
- 0295US10677697B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Jun 9, 2020·5 cites·5 claims
- 0394US9810649B2X-ray fluorescence analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Nov 7, 2017·9 cites·8 claims
- 0493US9620333B2Charged particle beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Apr 11, 2017·9 cites·7 claims
- 0592US11340176B2X-ray inspection apparatus and X-ray inspection methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted May 24, 2022·2 cites·10 claims
- 0692US11073453B2Automatic sample preparation apparatus and automatic sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Jul 27, 2021·2 cites·7 claims
- 0792US9213007B2Foreign matter detectorHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Dec 15, 2015·10 cites·5 claims
- 0891US11538656B2Sample holder and charged particle beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0991US10823686B2X-ray inspection method and X-ray inspection deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Nov 3, 2020·5 cites·16 claims
- 1091US9863896B2X-ray transmission inspection apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Jan 9, 2018·5 cites·6 claims
- 1191US9810648B2X-ray fluorescence analyzer and X-ray fluorescence analyzing methodHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Nov 7, 2017·5 cites·8 claims
- 1291US9347896B2Cross-section processing-and-observation method and cross-section processing-and-observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted May 24, 2016·8 cites·13 claims
- 1391US9275827B2Charged particle beam apparatus having needle probe that tracks target position changesHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Mar 1, 2016·7 cites·11 claims
- 1490US9829447B2X-ray fluorescence analyzer and method of displaying sample thereofHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Nov 28, 2017·5 cites·8 claims
- 1590US9679743B2Sample processing evaluation apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Jun 13, 2017·5 cites·18 claims
- 1689US11022570B2X-ray transmission inspection apparatus and X-ray transmission inspection methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Jun 1, 2021·3 cites·8 claims
- 1789US8803111B2Sample preparation apparatus and sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 12, 2014·9 cites·20 claims
- 1888US9791392B2X-ray fluorescence analyzer and measurement position adjusting method thereforeHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Oct 17, 2017·4 cites·10 claims
- 1987US9188553B2X-ray fluorescence analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Nov 17, 2015·7 cites·3 claims
- 2086US10971330B2Automatic processing deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Apr 6, 2021·7 cites·6 claims
- 2186US9111717B2Ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 18, 2015·7 cites·6 claims
- 2285US11486828B2Fluorescence photometer and observation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Nov 1, 2022·2 cites·10 claims
- 2385US10312051B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jun 4, 2019·3 cites·16 claims
- 2485US10236159B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Mar 19, 2019·3 cites·12 claims
- 2584US10903040B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Jan 26, 2021·2 cites·9 claims
- 2684US9726611B2Stabilized ICP emission spectrometer and method of usingHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Aug 8, 2017·5 cites·11 claims
- 2784US8916839B2Sample preparation method and apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Dec 23, 2014·5 cites·7 claims
- 2883US9001966B2Transmission X-ray analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Apr 7, 2015·4 cites·2 claims
- 2983US8637819B2Cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jan 28, 2014·5 cites·6 claims
- 3082US9410906B2X-ray fluorescence spectrometer comprising a temperature sensor, two external-air fans, and a circulation fanHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Aug 9, 2016·4 cites·8 claims
- 3182US8764994B2Method for fabricating emitterHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jul 1, 2014·4 cites·4 claims
- 3281US11133149B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Sep 28, 2021·1 cites·9 claims
- 3381US10636619B2Charged particle beam apparatus, and method and program for limiting stage driving range thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Apr 28, 2020·2 cites·8 claims
- 3481US10163602B2Ion beam systemHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Dec 25, 2018·2 cites·15 claims
- 3581US9899198B2Method for analyzing evolved gas and evolved gas analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Feb 20, 2018·3 cites·5 claims
- 3681US9865425B2Sample holder and sample holder setHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Jan 9, 2018·2 cites·3 claims
- 3781US9548185B2Cross section processing method and cross section processing apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Jan 17, 2017·4 cites·18 claims
- 3880US9885645B2Thermal analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Feb 6, 2018·2 cites·8 claims
- 3980US9773634B2Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2017·Granted Sep 26, 2017·2 cites·11 claims
- 4080US8813261B2Scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 19, 2014·7 cites·20 claims
- 4179US11835438B2Automatic sample preparation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Dec 5, 2023·0 cites·3 claims
- 4279US10908104B2Radiation analysis apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Feb 2, 2021·2 cites·7 claims
- 4379US9966226B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 8, 2018·2 cites·6 claims
- 4479US8621660B2Probe shape evaluation method for a scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Dec 31, 2013·5 cites·2 claims
- 4578US9831077B2Method for analyzing evolved gas and evolved gas analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Nov 28, 2017·2 cites·21 claims
- 4678US9046472B2Crystal analysis apparatus, composite charged particle beam device, and crystal analysis methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jun 2, 2015·2 cites·10 claims
- 4777US9658175B2X-ray analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted May 23, 2017·2 cites·8 claims
- 4877US9269539B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Feb 23, 2016·2 cites·6 claims
- 4976US9784700B2X-ray analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Oct 10, 2017·2 cites·4 claims
- 5076US9384941B2Charged particle beam apparatus and sample observation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jul 5, 2016·2 cites·8 claims
Showing the top 50 of 259 patent records by PatentIndex Score.
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