Assignee
HITACHI INFORMATION TECHNOLOGY
JP·3 granted patents·45 citations·filing 2001–2003
Top patents by PatentIndex Score
3 records- 0176US6922803B2Test method of semiconductor intergrated circuit and test pattern generatorHITACHI INFORMATION TECHNOLOGY·Filed 2001·Granted Jul 26, 2005·23 cites·12 claims
- 0257US6894882B2D.C. power supply circuit and electronic apparatus using such circuitsHITACHI INFORMATION TECHNOLOGY·Filed 2001·Granted May 17, 2005·17 cites·28 claims
- 0343US7013443B2Delay diagnosis method for semiconductor integrated circuit, computer program product for diagnosing delay of semiconductor integrated circuit and computer readable recording medium recording program thereonHITACHI INFORMATION TECHNOLOGY·Filed 2003·Granted Mar 14, 2006·5 cites·16 claims
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