Assignee
HOSOYA KOTARO
JP·3 granted patents·27 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0169USD684274SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Jun 11, 2013·19 cites·1 claims
- 0253US9159530B2Electron microscope sample holder and sample observation methodHOSOYA KOTARO·Filed 2011·Granted Oct 13, 2015·1 cites·10 claims
- 0346USD679411SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Apr 2, 2013·7 cites·1 claims
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