Assignee
HOU HSIN-MING
TW6 patents
Top patents by PatentIndex Score
US8434030B1Apr 30, 2013
Integrated circuit design and fabrication method by way of detecting and scoring hotspots
HOU HSIN-MING16 citations81
US9202914B2Dec 1, 2015
Semiconductor device and method for fabricating the same
HOU HSIN-MING1 citations51
US9159809B2Oct 13, 2015
Multi-gate transistor device
HOU HSIN-MING0 citations49
US8965550B2Feb 24, 2015
Experiments method for predicting wafer fabrication outcome
HOU HSIN-MING1 citations49
US8643397B2Feb 4, 2014
Transistor array for testing
HOU HSIN-MING0 citations49
US8410571B2Apr 2, 2013
Layout of dummy patterns
HOU HSIN-MING1 citations49