Assignee
HSIEH TE-HSIEN
TW·3 granted patents·4 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0172US8885917B2Mask pattern and correcting method thereofHSIEH TE-HSIEN·Filed 2011·Granted Nov 11, 2014·2 cites·11 claims
- 0269US8283093B2Optical proximity correction processHSIEH TE-HSIEN·Filed 2010·Granted Oct 9, 2012·2 cites·16 claims
- 0342US8806391B2Method of optical proximity correction according to complexity of mask patternHSIEH TE-HSIEN·Filed 2012·Granted Aug 12, 2014·0 cites·14 claims
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