Assignee

HSIEH YONG-FEN

TW·1 granted patent·2 citations·filing 2012–2012

Technology mixB01L1 G01N1 H01J1

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1 record

0164US8969827B2Specimen preparation for transmission electron microscopyHSIEH YONG-FEN·Filed 2012·Granted Mar 3, 2015·2 cites·8 claims

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