Assignee
HUANG YIN CHIN
TW·3 granted patents·7 citations·filing 2010–2011
Technology mixG11C3
Top patents by PatentIndex Score
3 records- 0162US8605525B2System and method for testing for defects in a semiconductor memory arrayHUANG YIN CHIN·Filed 2010·Granted Dec 10, 2013·4 cites·5 claims
- 0250US8504883B2System and method for testing integrated circuitsHUANG YIN-CHIN·Filed 2010·Granted Aug 6, 2013·2 cites·18 claims
- 0343US8498168B2Test method for screening local bit-line defects in a memory arrayHUANG YIN CHIN·Filed 2011·Granted Jul 30, 2013·1 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when HUANG YIN CHIN files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →