Assignee
HYPERNEX INC
US·5 granted patents·113 citations·filing 1998–2002
Top patents by PatentIndex Score
5 records- 0182US6882739B2Method and apparatus for rapid grain size analysis of polycrystalline materialsHYPERNEX INC·Filed 2001·Granted Apr 19, 2005·33 cites·44 claims
- 0279US6678347B1Method and apparatus for quantitative phase analysis of textured polycrystalline materialsHYPERNEX INC·Filed 2002·Granted Jan 13, 2004·20 cites·21 claims
- 0372US6301330B1Apparatus and method for texture analysis on semiconductor wafersHYPERNEX INC·Filed 1999·Granted Oct 9, 2001·44 cites·40 claims
- 0462US6792075B2Method and apparatus for thin film thickness mappingHYPERNEX INC·Filed 2002·Granted Sep 14, 2004·4 cites·24 claims
- 0548US6058160APhoto-sensor fiber-optic stress analysis systemHYPERNEX INC·Filed 1998·Granted May 2, 2000·12 cites·20 claims
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