Assignee
IND HOLOGRAPHICS INC
US·6 granted patents·396 citations·filing 1978–1985
Top patents by PatentIndex Score
6 records- 0197US4702594ADouble exposure interferometric analysis of structures and employing ambient pressure stressingIND HOLOGRAPHICS INC·Filed 1982·Granted Oct 27, 1987·154 cites·4 claims
- 0297US4425039AApparatus for the practice of double exposure interferometric non-destructive testingIND HOLOGRAPHICS INC·Filed 1982·Granted Jan 10, 1984·173 cites·8 claims
- 0372US4392745ATilt head camera for interferometric analysis of tiresIND HOLOGRAPHICS INC·Filed 1981·Granted Jul 12, 1983·26 cites·8 claims
- 0464US4690552AOptical method and apparatus for strain analysisIND HOLOGRAPHICS INC·Filed 1985·Granted Sep 1, 1987·23 cites·7 claims
- 0552US4620223AInterferometric deformation analysis systemIND HOLOGRAPHICS INC·Filed 1984·Granted Oct 28, 1986·12 cites·15 claims
- 0645US4171794AFixturing for inspection of the interior of tire casingsIND HOLOGRAPHICS INC·Filed 1978·Granted Oct 23, 1979·8 cites·6 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →