Assignee
IND MEASUREMENT SYSTEMS INC
US·2 granted patents·24 citations·filing 2005–2008
Top patents by PatentIndex Score
2 records- 0188US7726875B2Methods and apparatus for monitoring a condition of a materialIND MEASUREMENT SYSTEMS INC·Filed 2008·Granted Jun 1, 2010·15 cites·25 claims
- 0283US7470056B2Methods and apparatus for monitoring a condition of a materialIND MEASUREMENT SYSTEMS INC·Filed 2005·Granted Dec 30, 2008·9 cites·27 claims
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