Assignee
INFINEON TECHNOLOGIES RICHMOND
US·49 granted patents·8 pending applications·775 citations·filing 1999–2006
Top patents by PatentIndex Score
57 records- 0194US6459123B1Double gated transistorINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Oct 1, 2002·116 cites·7 claims
- 0291US7184853B2Lithography method and system with correction of overlay offset errors caused by wafer processingINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Granted Feb 27, 2007·40 cites·17 claims
- 0389US7127304B1System and method to predict the state of a process controller in a semiconductor manufacturing facilityINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Granted Oct 24, 2006·70 cites·35 claims
- 0484US6852473B2Anti-reflective coating conformality controlINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Feb 8, 2005·46 cites·20 claims
- 0582US7150796B2Method of removing PECVD residues of fluorinated plasma using in-situ H2 plasmaINFINEON TECHNOLOGIES RICHMOND·Filed 2004·Granted Dec 19, 2006·23 cites·1 claims
- 0681US6404250B1On-chip circuits for high speed memory testing with a slow memory testerINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Jun 11, 2002·36 cites·16 claims
- 0777US6479396B1Dry polymer and oxide veil removal for post etch cleaningINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Nov 12, 2002·25 cites·16 claims
- 0874US7358493B2Method and apparatus for automated beam optimization in a scanning electron microscopeINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Granted Apr 15, 2008·4 cites·28 claims
- 0974US6496958B1Yield prediction and statistical process control using predicted defect related yield lossINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Dec 17, 2002·52 cites·34 claims
- 1074US6307768B1Bitline twist with equalizer functionINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Oct 23, 2001·20 cites·22 claims
- 1173US6564346B1Advanced bit fail map compression with fail signature analysisINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted May 13, 2003·43 cites·33 claims
- 1272US6717431B2Method for semiconductor yield loss calculationINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Apr 6, 2004·20 cites·20 claims
- 1368US6499120B1Usage of redundancy data for displaying failure bit maps for semiconductor devicesINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Dec 24, 2002·26 cites·24 claims
- 1467US6818534B2DRAM having improved leakage performance and method for making sameINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Nov 16, 2004·13 cites·4 claims
- 1567US6464445B2System and method for improved throughput of semiconductor wafer processingINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Oct 15, 2002·21 cites·14 claims
- 1666US7208326B2Edge protection process for semiconductor device fabricationINFINEON TECHNOLOGIES RICHMOND·Filed 2004·Granted Apr 24, 2007·13 cites·20 claims
- 1764US7279258B2Method and arrangement for controlling focus parameters of an exposure toolINFINEON TECHNOLOGIES RICHMOND·Filed 2004·Granted Oct 9, 2007·9 cites·15 claims
- 1864US6803156B2Electrostatic damage (ESD) protected photomaskINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Oct 12, 2004·8 cites·36 claims
- 1964US6696349B2STI leakage reductionINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Feb 24, 2004·13 cites·13 claims
- 2063US7009193B2Utilization of an ion gauge in the process chamber of a semiconductor ion implanterINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Mar 7, 2006·7 cites·14 claims
- 2161US7381576B2Method and apparatus for monitoring precision of water placement alignmentINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Granted Jun 3, 2008·4 cites·13 claims
- 2261US6553521B1Method for efficient analysis semiconductor failuresINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Apr 22, 2003·15 cites·17 claims
- 2360US6930345B2Increase in deep trench capacitance by a central ground electrodeINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Aug 16, 2005·10 cites·12 claims
- 2460US6725403B1Efficient redundancy calculation system and method for various types of memory devicesINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Apr 20, 2004·26 cites·26 claims
- 2557US6957581B2Acoustic detection of mechanically induced circuit damageINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Oct 25, 2005·7 cites·26 claims
- 2657US6845478B2Method and apparatus for collecting and displaying bit-fail-map informationINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Jan 18, 2005·15 cites·20 claims
- 2756US6477095B2Method for reading semiconductor die information in a parallel test and burn-in systemINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Nov 5, 2002·9 cites·14 claims
- 2855US6687170B2System and method for storing parity information in fusesINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Feb 3, 2004·10 cites·26 claims
- 2954US7051253B2Pseudo fail bit map generation for RAMS during component test and burn-in in a manufacturing environmentINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted May 23, 2006·8 cites·17 claims
- 3054US6503784B1Double gated transistorINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Jan 7, 2003·5 cites·14 claims
- 3153US6812162B2Rapid deposition of borosilicate glass filmsINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Nov 2, 2004·4 cites·28 claims
- 3253US6517641B2Apparatus and process for collecting trace metals from wafersINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Feb 11, 2003·5 cites·14 claims
- 3351US6434725B1Method and system for semiconductor testing using yield correlation between global and class parametersINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Aug 13, 2002·6 cites·26 claims
- 3450US6417063B1Folded deep trench capacitor and methodINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Jul 9, 2002·7 cites·13 claims
- 3547US6828249B2System and method for enhanced monitoring of an etch processINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Dec 7, 2004·3 cites·13 claims
- 3647US6490209B1Memory employing multiple enable/disable modes for redundant elements and testing method using sameINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Dec 3, 2002·4 cites·12 claims
- 3746US6737671B2Current measurement circuit and method for voltage regulated semiconductor integrated circuit devicesINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted May 18, 2004·3 cites·11 claims
- 3843US6803301B2Fuse configuration with modified capacitor border layout for a semiconductor storage deviceINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Oct 12, 2004·3 cites·8 claims
- 3942US7402487B2Process for fabricating a semiconductor device having deep trench structuresINFINEON TECHNOLOGIES RICHMOND·Filed 2004·Granted Jul 22, 2008·3 cites·22 claims
- 4041US6434503B1Automated creation of specific test programs from complex test programsINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Aug 13, 2002·12 cites·23 claims
- 4141US2004055708A1Apparatus and method for in-situ cleaning of borosilicate (BSG) and borophosphosilicate (BPSG) films from CVD chambersINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Application pending·0 cites
- 4240US7351642B2Deglaze route to compensate for film non-uniformities after STI oxide processingINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Granted Apr 1, 2008·0 cites·21 claims
- 4340US7214552B2Eliminating systematic process yield loss via precision wafer placement alignmentINFINEON TECHNOLOGIES RICHMOND·Filed 2004·Granted May 8, 2007·3 cites·13 claims
- 4440US6400134B1Automated bad socket masking in real-time for test handlersINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Jun 4, 2002·4 cites·18 claims
- 4538US6538939B1Memory employing multiple enable/disable modes for redundant elements and testing method using sameINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Mar 25, 2003·1 cites·8 claims
- 4638US2005092254A1PVD transfer robot short bladeINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Application pending·0 cites
- 4737US7003432B2Method of and system for analyzing cells of a memory deviceINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Feb 21, 2006·3 cites·19 claims
- 4837US2006265098A1System and method for real time prediction and/or inheritance of process controller settings in a semiconductor manufacturing facilityINFINEON TECHNOLOGIES RICHMOND·Filed 2005·Application pending·0 cites
- 4936US7001856B2Method of calculating a pressure compensation recipe for a semiconductor wafer implanterINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Feb 21, 2006·0 cites·9 claims
- 5036US2006127293A1System and method for processing semiconductor material using radiant energy sourceINFINEON TECHNOLOGIES RICHMOND·Filed 2006·Application pending·0 cites
Showing the top 50 of 57 patent records by PatentIndex Score.
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