Assignee
INOUE KAZUTOSHI
JP·2 granted patents·5 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0179US8836341B2Semiconductor circuit, semiconductor device, method of diagnosing abnormality of wire, and computer readable storage mediumINOUE KAZUTOSHI·Filed 2011·Granted Sep 16, 2014·5 cites·8 claims
- 0248US8412902B2Signal processor and signal processing systemINOUE KAZUTOSHI·Filed 2009·Granted Apr 2, 2013·0 cites·6 claims
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