Assignee
INSTR INC
US·17 granted patents·7 pending applications·15 citations·filing 2017–2025
Top patents by PatentIndex Score
24 records- 0195US11989872B2Modular optical inspection stationINSTR INC·Filed 2022·Granted May 21, 2024·2 cites·20 claims
- 0292US10984526B2Method for predicting defects in assembly unitsINSTR INC·Filed 2020·Granted Apr 20, 2021·3 cites·20 claims
- 0391US11688056B2Method for predicting defects in assembly unitsINSTR INC·Filed 2021·Granted Jun 27, 2023·2 cites·20 claims
- 0488US10783624B2Modular optical inspection stationINSTR INC·Filed 2017·Granted Sep 22, 2020·4 cites·20 claims
- 0586US2025078370A1Methods for automatically generating a common measurement across multiple assembly unitsINSTR INC·Filed 2024·Application pending·0 cites
- 0686US2025111498A1Method for predicting defects in assembly unitsINSTR INC·Filed 2024·Application pending·0 cites
- 0785US2025391009A1Method for monitoring manufacture of assembly unitsINSTR INC·Filed 2025·Application pending·0 cites
- 0880US11132787B2Method for monitoring manufacture of assembly unitsINSTR INC·Filed 2019·Granted Sep 28, 2021·2 cites·20 claims
- 0979US12579630B2Modular optical inspection stationINSTR INC·Filed 2024·Granted Mar 17, 2026·0 cites·16 claims
- 1079US12373931B2Method for monitoring manufacture of assembly unitsINSTR INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 1179US12205274B2Method for predicting defects in assembly unitsINSTR INC·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 1274US12020415B2Method for monitoring manufacture of assembly unitsINSTR INC·Filed 2022·Granted Jun 25, 2024·0 cites·19 claims
- 1374US10789701B2Method for predicting defects in assembly unitsINSTR INC·Filed 2018·Granted Sep 29, 2020·1 cites·19 claims
- 1473US12190418B2Methods for automatically generating a common measurement across multiple assembly unitsINSTR INC·Filed 2021·Granted Jan 7, 2025·0 cites·17 claims
- 1573US10713776B2Method for predicting defects in assembly unitsINSTR INC·Filed 2018·Granted Jul 14, 2020·1 cites·20 claims
- 1672US2026017778A1Method for predicting defects in assembly unitsINSTR INC·Filed 2025·Application pending·0 cites
- 1771US11763443B2Method for monitoring manufacture of assembly unitsINSTR INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1865US11321824B2Modular optical inspection stationINSTR INC·Filed 2020·Granted May 3, 2022·0 cites·20 claims
- 1962US11164304B2Methods for automatically generating a common measurement across multiple assembly unitsINSTR INC·Filed 2019·Granted Nov 2, 2021·0 cites·17 claims
- 2061US12380553B2Method for predicting defects in assembly unitsINSTR INC·Filed 2022·Granted Aug 5, 2025·0 cites·20 claims
- 2160US2024331134A1Methods for automatically generating a common measurement across multiple assembly unitsINSTR INC·Filed 2024·Application pending·0 cites
- 2259US12585252B2Method for automatically adjusting manufacturing limits prescribed on an assembly lineINSTR INC·Filed 2022·Granted Mar 24, 2026·0 cites·20 claims
- 2359US2024257427A1Methods for automatically generating a common measurement across multiple assembly unitsINSTR INC·Filed 2024·Application pending·0 cites
- 2444US2025245812A1Method for automatically detecting defects in assembly unitsINSTR INC·Filed 2025·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →