Assignee
INSTRON CORP
US·18 granted patents·388 citations·filing 1977–2004
Top patents by PatentIndex Score
18 records- 0181US6247356B1Hardness testerINSTRON CORP·Filed 1999·Granted Jun 19, 2001·76 cites·23 claims
- 0277US6142010APenetration hardness testerINSTRON CORP·Filed 1997·Granted Nov 7, 2000·51 cites·20 claims
- 0377US5616857APenetration hardness testerINSTRON CORP·Filed 1996·Granted Apr 1, 1997·49 cites·19 claims
- 0469US4721000AAxial loading material testingINSTRON CORP·Filed 1986·Granted Jan 26, 1988·34 cites·22 claims
- 0566USD394015SHardness testerINSTRON CORP·Filed 1997·Granted May 5, 1998·14 cites·1 claims
- 0664US4160325AExtensometerINSTRON CORP·Filed 1977·Granted Jul 10, 1979·27 cites·11 claims
- 0760US7004017B1Materials tester latching coupling deviceINSTRON CORP·Filed 2004·Granted Feb 28, 2006·4 cites·6 claims
- 0860US6508132B1Dynamic load cell apparatusINSTRON CORP·Filed 1999·Granted Jan 21, 2003·28 cites·5 claims
- 0958US4194402ATesting machine gripINSTRON CORP·Filed 1978·Granted Mar 25, 1980·22 cites·6 claims
- 1055US4823473AExtensometer for material testing machineINSTRON CORP·Filed 1987·Granted Apr 25, 1989·18 cites·12 claims
- 1150US5413306ATest frameINSTRON CORP·Filed 1993·Granted May 9, 1995·15 cites·10 claims
- 1240US5606515ASensor conditioning circuitry for use with electrically excited transducersINSTRON CORP·Filed 1993·Granted Feb 25, 1997·16 cites·41 claims
- 1339US5329820AMaterials testing gripINSTRON CORP·Filed 1993·Granted Jul 19, 1994·9 cites·8 claims
- 1438USD351804SStress:strain materials testing instrumentINSTRON CORP·Filed 1993·Granted Oct 25, 1994·4 cites·1 claims
- 1532US6099223AAdjustable wedge washerINSTRON CORP·Filed 1998·Granted Aug 8, 2000·11 cites·9 claims
- 1631USRE36392ETest frameINSTRON CORP·Filed 1997·Granted Nov 16, 1999·3 cites·11 claims
- 1730US5440934ATest apparatus limit switch assemblyINSTRON CORP·Filed 1993·Granted Aug 15, 1995·4 cites·13 claims
- 1815US5567866ASide load testerINSTRON CORP·Filed 1994·Granted Oct 22, 1996·3 cites·7 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →