Assignee
IPEC PREC INC
US·2 granted patents·15 citations·filing 1999–1999
Top patents by PatentIndex Score
2 records- 0136US6242926B1Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the articleIPEC PREC INC·Filed 1999·Granted Jun 5, 2001·11 cites·8 claims
- 0234US6275770B1Method to remove station-induced error pattern from measured object characteristics and compensate the measured object characteristics with the errorIPEC PREC INC·Filed 1999·Granted Aug 14, 2001·4 cites·15 claims
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