Assignee
ISC CO LTD
KR·11 granted patents·6 pending applications·36 citations·filing 2013–2023
Top patents by PatentIndex Score
17 records- 0189US9696344B2Test socket which allows for ease of alignmentISC CO LTD·Filed 2013·Granted Jul 4, 2017·9 cites·8 claims
- 0287US9310395B2Probe member for pogo pinISC CO LTD·Filed 2014·Granted Apr 12, 2016·7 cites·10 claims
- 0385US9726693B2Probe member for pogo pinISC CO LTD·Filed 2014·Granted Aug 8, 2017·6 cites·15 claims
- 0478US11442079B2Contact device for electrical testISC CO LTD·Filed 2020·Granted Sep 13, 2022·1 cites·18 claims
- 0575US9423419B2Test socket including electrode supporting portion and method of manufacturing test socketISC CO LTD·Filed 2013·Granted Aug 23, 2016·3 cites·3 claims
- 0668US9759742B2Test socket including conductive particles in which through-holes are formed and method for manufacturing sameISC CO LTD·Filed 2013·Granted Sep 12, 2017·5 cites·9 claims
- 0763US9488675B2Test socket having high-density conductive unit, and method for manufacturing sameISC CO LTD·Filed 2013·Granted Nov 8, 2016·4 cites·10 claims
- 0860US11073536B2ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assemblyISC CO LTD·Filed 2019·Granted Jul 27, 2021·1 cites·20 claims
- 0954US12504468B2Test connectorISC CO LTD·Filed 2023·Granted Dec 23, 2025·0 cites·15 claims
- 1054US2025231218A1Test socketISC CO LTD·Filed 2022·Application pending·0 cites
- 1148US2025389768A1Test connectorISC CO LTD·Filed 2023·Application pending·0 cites
- 1245US2015377923A1Test socket with high density conduction sectionISC CO LTD·Filed 2014·Application pending·0 cites
- 1344US11385259B2Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe memberISC CO LTD·Filed 2018·Granted Jul 12, 2022·0 cites·11 claims
- 1444US2015355233A1Test socket and socket bodyISC CO LTD·Filed 2013·Application pending·0 cites
- 1543US11555829B2Probe member for pogo pin, manufacturing method therefor and pogo pin comprising sameISC CO LTD·Filed 2018·Granted Jan 17, 2023·0 cites·13 claims
- 1635US2015130497A1Electrical Test SocketISC CO LTD·Filed 2014·Application pending·0 cites
- 1731US2016018440A1Contact Device for Test and Test SocketISC CO LTD·Filed 2015·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →