Assignee
ISHIBE YOSHIHIRO
JP·2 granted patents·0 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0136US8767300B2Diffraction element, manufacturing method for diffraction element, and spectrometer using the sameISHIBE YOSHIHIRO·Filed 2010·Granted Jul 1, 2014·0 cites·12 claims
- 0235US8493643B2Multi-beam light scanning apparatus and image forming apparatus using the sameISHIBE YOSHIHIRO·Filed 2010·Granted Jul 23, 2013·0 cites·21 claims
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