Assignee
ISHIJIMA TATSUAKI
JP·2 granted patents·0 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0146US8178836B2Electrostatic charge measurement method, focus adjustment method, and scanning electron microscopeISHIJIMA TATSUAKI·Filed 2010·Granted May 15, 2012·0 cites·14 claims
- 0232US9129775B2Specimen potential measuring method, and charged particle beam deviceISHIJIMA TATSUAKI·Filed 2010·Granted Sep 8, 2015·0 cites·11 claims
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