Assignee
ISHIKAWA AKIO
JP·4 granted patents·9 pending applications·40 citations·filing 2004–2011
Top patents by PatentIndex Score
13 records- 0195US10109427B2Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizerISHIKAWA AKIO·Filed 2011·Granted Oct 23, 2018·16 cites·13 claims
- 0289US8311089B2Multi-view video compression coding method and apparatusISHIKAWA AKIO·Filed 2007·Granted Nov 13, 2012·15 cites·20 claims
- 0376US8243122B2Video method for generating free viewpoint video image using divided local regionsISHIKAWA AKIO·Filed 2008·Granted Aug 14, 2012·8 cites·3 claims
- 0464US8259160B2Method for generating free viewpoint video image in three-dimensional movement and recording mediumISHIKAWA AKIO·Filed 2009·Granted Sep 4, 2012·1 cites·8 claims
- 0548US2007296962A1Surface inspection apparatus and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 0645US2008040064A1Surface inspection apparatus and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 0745US2006222232A1Appearance inspection apparatus and appearance inspection methodISHIKAWA AKIO·Filed 2006·Application pending·0 cites
- 0844US2007165940A1Semiconductor surface inspection apparatus, surface inspection method, and semiconductor manufacturing apparatusISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 0944US2007165211A1Semiconductor manufacturing apparatus, semiconductor surface inspection apparatus, and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 1043US2008175466A1Inspection apparatus and inspection methodISHIKAWA AKIO·Filed 2008·Application pending·0 cites
- 1141US2007053580A1Image defect inspection apparatus, image defect inspection system, defect classifying apparatus, and image defect inspection methodISHIKAWA AKIO·Filed 2006·Application pending·0 cites
- 1240US2006245635A1Appearance inspection apparatus and appearance inspection methodISHIKAWA AKIO·Filed 2006·Application pending·0 cites
- 1340US2006280358A1Pattern comparison inspection method and pattern comparison inspection deviceISHIKAWA AKIO·Filed 2004·Application pending·0 cites
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