Assignee
ISHIKAWA TORU
JP·11 granted patents·68 citations·filing 2009–2013
Top patents by PatentIndex Score
11 records- 0195US8803308B2Semiconductor device having chip crack detection structureISHIKAWA TORU·Filed 2013·Granted Aug 12, 2014·16 cites·5 claims
- 0295US8624401B2Semiconductor device having chip crack detection structureISHIKAWA TORU·Filed 2012·Granted Jan 7, 2014·20 cites·20 claims
- 0387US8780647B2Semiconductor deviceISHIKAWA TORU·Filed 2012·Granted Jul 15, 2014·6 cites·20 claims
- 0483US9018969B2Semiconductor device with aligned bumpsISHIKAWA TORU·Filed 2012·Granted Apr 28, 2015·10 cites·22 claims
- 0583US8953409B2Semiconductor device capable of minimizing mutual effects between two different operations thereinISHIKAWA TORU·Filed 2011·Granted Feb 10, 2015·7 cites·23 claims
- 0668US8724296B2Solid electrolytic capacitor and fabrication method thereofISHIKAWA TORU·Filed 2010·Granted May 13, 2014·1 cites·4 claims
- 0767US8209560B2Transmission system where a first device generates information for controlling transmission and latch timing for a second deviceISHIKAWA TORU·Filed 2009·Granted Jun 26, 2012·3 cites·30 claims
- 0863US8299845B2Semiconductor deviceISHIKAWA TORU·Filed 2010·Granted Oct 30, 2012·2 cites·19 claims
- 0962US8699286B2Semiconductor deviceISHIKAWA TORU·Filed 2011·Granted Apr 15, 2014·2 cites·15 claims
- 1059US8514635B2Memory system and control method thereforISHIKAWA TORU·Filed 2011·Granted Aug 20, 2013·1 cites·21 claims
- 1152US9621005B2Rotor of rotating electrical machineISHIKAWA TORU·Filed 2013·Granted Apr 11, 2017·0 cites·8 claims
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