Assignee
ISOZAKI HISASHI
JP·3 granted patents·1 pending application·6 citations·filing 2009–2011
Top patents by PatentIndex Score
4 records- 0172US8692194B2Electron microscope deviceISOZAKI HISASHI·Filed 2011·Granted Apr 8, 2014·3 cites·8 claims
- 0268US8791415B2Electron microscope deviceISOZAKI HISASHI·Filed 2009·Granted Jul 29, 2014·2 cites·6 claims
- 0356US8243264B2Measuring apparatusISOZAKI HISASHI·Filed 2010·Granted Aug 14, 2012·1 cites·6 claims
- 0439US2011043808A1Measuring apparatusISOZAKI HISASHI·Filed 2010·Application pending·0 cites
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