Assignee
JAMANN JOSEPH J
US·2 granted patents·1 pending application·14 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0185US8307324B2Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristicsJAMANN JOSEPH J·Filed 2011·Granted Nov 6, 2012·6 cites·6 claims
- 0284US8281266B2Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed therebyJAMANN JOSEPH J·Filed 2009·Granted Oct 2, 2012·8 cites·15 claims
- 0348US2013055175A1Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed therebyJAMANN JOSEPH J·Filed 2012·Application pending·0 cites
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