Assignee
JPK INSTRUMENTS AG
DE·11 granted patents·177 citations·filing 2002–2013
Top patents by PatentIndex Score
11 records- 0194US7022985B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Apr 4, 2006·122 cites·18 claims
- 0277US7442922B2Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technologyJPK INSTRUMENTS AG·Filed 2003·Granted Oct 28, 2008·18 cites·20 claims
- 0372US8381311B2Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe systemJPK INSTRUMENTS AG·Filed 2008·Granted Feb 19, 2013·6 cites·20 claims
- 0466US7155962B2Method and apparatus to study a surfactantJPK INSTRUMENTS AG·Filed 2002·Granted Jan 2, 2007·8 cites·23 claims
- 0557US8368017B2Method for the operation of a measurement system with a scanning probe microscope and a measurement systemJPK INSTRUMENTS AG·Filed 2006·Granted Feb 5, 2013·3 cites·20 claims
- 0655US7473894B2Apparatus and method for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2006·Granted Jan 6, 2009·4 cites·22 claims
- 0755US7114405B2Probe mounting device for a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Oct 3, 2006·10 cites·16 claims
- 0852US7971266B2Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscopeJPK INSTRUMENTS AG·Filed 2009·Granted Jun 28, 2011·0 cites·28 claims
- 0950US6998602B2Method of and an apparatus for measuring a specimen by means of a scanning probe microscopeJPK INSTRUMENTS AG·Filed 2002·Granted Feb 14, 2006·6 cites·11 claims
- 1046US7934323B2Method and a device for the positioning of a displaceable component in an examining systemJPK INSTRUMENTS AG·Filed 2006·Granted May 3, 2011·0 cites·21 claims
- 1138US9080937B2Apparatus and a method for investigating a sample by means of several investigation methodsJPK INSTRUMENTS AG·Filed 2013·Granted Jul 14, 2015·0 cites·14 claims
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