Assignee
JYWE WEN-YUH
TW·6 granted patents·7 citations·filing 2009–2012
Top patents by PatentIndex Score
6 records- 0179US8575791B2Manufacturing-process equipmentJYWE WEN-YUH·Filed 2010·Granted Nov 5, 2013·5 cites·6 claims
- 0249US8325333B2Geometric error measuring deviceJYWE WEN-YUH·Filed 2009·Granted Dec 4, 2012·2 cites·8 claims
- 0340US8477321B2Optical parallelism measurement deviceJYWE WEN-YUH·Filed 2011·Granted Jul 2, 2013·0 cites·8 claims
- 0439US9244458B2Method of numerical-control scraping of a work pieceJYWE WEN-YUH·Filed 2012·Granted Jan 26, 2016·0 cites·7 claims
- 0537US8111405B2Automatic scan and mark apparatusJYWE WEN-YUH·Filed 2009·Granted Feb 7, 2012·0 cites·4 claims
- 0636US8542358B2Optical calibration and testing device for machine toolsJYWE WEN-YUH·Filed 2011·Granted Sep 24, 2013·0 cites·8 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →