Assignee
K PATENTS OY
FI·2 granted patents·30 citations·filing 1983–1987
Technology mixG01N2
Top patents by PatentIndex Score
2 records- 0157US4571075AMeasuring window for a process refractometerK PATENTS OY·Filed 1983·Granted Feb 18, 1986·17 cites·2 claims
- 0246US4776697AMethod for the illumination of particles contained in a medium for an optical analysis, and an optical particle analyserK PATENTS OY·Filed 1987·Granted Oct 11, 1988·13 cites·4 claims
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